Semiconductor refrigeration wafer air tightness tester

Quantitative_Dual_Channel_Semiconductor_Cooling_Flake 2

cooling panelDual-channel airtightness tester::
Instrument Model: JC-DL2, Product to be tested: semiconductor refrigeration chip, Test Pressure: 20kPa, Leakage Pressure: 100Pa, Test Principle: Volumetric Quantitative Method, Support Non-standard Customization

water cooling padsAir tightness testing equipment

☑️ self-developed OS system, more streamlined interface, simple operation
☑️ is based on a 32-bit processor with a 24-bit A/D converter for fast response time for AI algorithm testing.
☑️ Original imported pressure sensor chip, automatic environmental drift correction
☑️ Original imported SMC precision regulator and high sensitivity sensor, high accuracy test data
☑️ is equipped with powerful IoT functions for remote management.
☑️ supports barcode scanning and MES data interactive uploading, traceable history and printing.
☑️ Multi-channel can be customized to save labor and increase production capacity.

test pattern

☑️ Leakage Test
☑️ Leakage rate test

Working Principle

3. Volume Quantitative test principle
Volumetric quantitative air tightness test schematic diagram

For more detailed airtightness testing solutions and equipment selection, please visit the website of Jingcheng Industrial Technology:www.air-tester.comOr contact online customer service

Online Message

滚动至顶部
滚动至顶部